Meng Xu, Sen Jia, Shenzhen University, China

Yuhan Liu, Zhenming Peng, University of Electronic Science and Technology of China, China

Haoxuan Yuan, Yun Zhang, Harbin Institute of Technology, China; Xiaodong Gong, Southwest electronic equipment research institute, China; Hongbo Li, Muqun Niu, Harbin Institute of Technology, China

Eniuce Souza, State University of Maringa, Brazil; Ademir Marques Jr, Rafael Horota, Lucas Kupssinsku, Pedro Rossa, Alysson Aires, Luiz Silveira Junior, Maurício Veronez, Unisinos University, Brazil; Carol Cazarin, PETROBRAS, Brazil

Di He, Shanghai Jiao Tong University, China; Fusheng Zhu, Guangdong Communications & Networks Institute, China; Lijuan Sun, NXP Semiconductors, China; Wenxian Yu, Shanghai Jiao Tong University, China

Hui Wang, State Grid Anhui Electric Power CO., LTD, China; Shunsheng Zhang, University of Electronic Science and Technology of China, China; Lu Zhang, Xiaowei Wang, State Grid Anhui Electric Power CO., LTD, China; Bang Huang, University of Electronic Science and Technology of China, China

Wei Wang, Zhuangzhuang Tian, Ronghui Zhan, Jun Zhang, Zhaowen Zhuang, National University of Defense Technology, China

Rui Zhang, Yinghui Quan, Xidian University, China; Ran Xu, Beijing Institue of Electronic System Engineering, China; Shengqi Zhu, Yachao Li, Mengdao Xing, Xidian University, China

Zhiyong Wang, Chenwei Wang, Jifang Pei, Yulin Huang, Yin Zhang, Haiguang Yang, University of Electronic Science and Technology of China, China

Xudong Hu, Penglin Zhang, Qi Zhang, Wuhan University, China

Xu Tang, Huayu Zhang, Jingjing Ma, Xiangrong Zhang, Licheng Jiao, Xidian University, China

Lingling Li, Lin Cheng, Xiaohui Guo, Xu Liu, Licheng Jiao, Fang Liu, Xidian University, China